Text Box: Achieving Automotive Quality CSR Surface Analysis—A Problem Solving Tool? LSA FA Requirements for Power Semiconductor Manufacture IR Failure Analysis and Future Capabilities INNOS Text Box: (01506) 424890 www.nmi.org.uk/events Text Box: New Hall University of Cambridge Huntingdon Road Cambridge CB3 0DF Click here for map Text Box: 28th April 2006 Text Box: Interested parties should register early as places are limited Click here to Register or request further details Text Box: Sector Networks: FACR Failure Analysis, Characterisation & Reliability Text Box: Summary: The complexity of today's IC products place escalating demands on Quality & Reliability and there is an extensive range of methods and techniques available to industry to meet these challenges. The UK has a wealth of resource yet industry would benefit from greater awareness of methods and local capabilities. The NMI FACR network was established to create a focal point of services and sources, provide information on available techniques and facilitate best practices for UK based operations. This “MUST ATTEND” event is *** FREE to NMI members and invited guests Text Box: Testing to Q100 Automotive Standards MASER Ion Beam Techniques for Materials Modification and Analysis UNIVERSITY OF SURREY

The NMI would like to thank our event sponsors

Text Box: Agenda Overview Link to CSR WebsiteText Box: Panel Session “Are FACR techniques aligned with industry future needs?” CSR - DELTA - PHILIPS SEMICONDUCTOR - ZETEX Lunch, refreshments and networking opportunities are provided