Text Box: Achieving Automotive Quality
	CSR

Surface Analysis—A Problem Solving Tool?				LSA

FA Requirements for Power Semiconductor Manufacture 		IR

Failure Analysis and Future Capabilities
	INNOS
Text Box: (01506) 424890
www.nmi.org.uk/events
Text Box: New Hall
University of Cambridge
Huntingdon Road
Cambridge
CB3 0DF
Click here for map
Text Box: 28th April 2006
Text Box: Interested parties should register early as places are limited
Click here to Register 
or request further details 
Text Box: Sector Networks: FACR 
Failure Analysis, Characterisation & Reliability
Text Box: Summary: The complexity of today's IC products place escalating demands on Quality & Reliability and there is an extensive range of methods and techniques available to industry to meet these challenges. The UK has a wealth of resource yet industry would benefit from greater awareness of methods and local capabilities. The NMI FACR network was established to create a focal point of services and sources, provide information on available techniques and facilitate best practices for UK based operations. This “MUST ATTEND” event is  *** FREE to NMI members and invited guests
Text Box: Testing to Q100 Automotive Standards		MASER

Ion Beam Techniques for Materials Modification and Analysis 	
	UNIVERSITY OF SURREY

The NMI would like to thank our event sponsors

Text Box: Agenda Overview
Link to CSR WebsiteText Box: Panel Session 
“Are FACR techniques aligned with industry future needs?”
CSR - DELTA - PHILIPS SEMICONDUCTOR - ZETEX
Lunch, refreshments and networking opportunities are provided