National Microelectronics Institute

Events

Defects-Based Testing course

Venue:

t.b.c.

Date:
Mon 06 Dec 2010 - Wed 08 Dec 2010
Cost:

Cost per attendee:

USD $1195 ( non-members)

USD$995  ( NMI member)

Booking Details:

For registration please contact:

info@firstsilicon.com

 

The skills building series is divided into four segments:

1. Electrical behaviour of defects

2. Fault models for defect based testing

3. Production test methods

4. The economic and quality impact of defect based testing

 

More course information at

http://www.semitracks.com/index.php/en/courses/public-courses/test/defect-based-testing