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Following the re-branding of FACR to Q&R at the Wolfson 2008 event, we are pleased to announce our first Q&R network event, to be hosted by UNISEM. As the challenge of Time to Market and demands of Customer quality get tougher, this event will look at the new approaches that are being adopted by companies such as NXP as the Industry moves from Stress Based to Knowledge Based qualification methodologies. This new approach which embraces “Designing-in-Quality”, could offer your company major advantages such as fewer parts needed for Qualification, elimination of Long product Qualification times and improved prediction of Field reliability.

In addition to the Technical presentations from a range of speakers representing a sample of the supply chain, there will also be a mini Table Top Exhibition of Analytical and Test Suppliers offering solutions in the Quality and Reliability process. As always , there will be ample opportunity during our extended Buffet Lunch break to network with delegates from a variety of organisations ranging from Fabless semiconductor providers, IDMs, Analytical services, Research and academic institutions.

 

Note : presentations and the attendee list from this event are available in the members' area

 
Agenda

08:45 Registration and Refreshments

09:30 Welcome & Introduction
Paul Jarvie, NMI

09:35 Knowledge based Qual strategies
Derek Ward, NXP Semiconductors

10:05 Test data uses in application based qual
Bernie Ramsay, UNISEM

10:35 Coffee Break

10:55 De-risking the Qual through data review and interpretation
Stephen Meats, RCL

11:25 TBC
Nick Renaud-Bezot, SERMA Technologies

11:55 Buffet Lunch & Line Tour

13:10 Safe Product Launch with Fast Reliability Feedback
Thorsten Bucksch, RoodMicrotec

13:40 Return on investment through extensive Reliability Test – A case study
Trevor Gainey, Cam Semi / Ingenious Quality Limited

14:10 Advanced Packaging Technologies and Reliability
Zoubir Khalfi, Dialog Semiconductor

14:40 Coffee Break

15:00 Fast reliability assessment of SMT solder interconnects
Kees Revenberg, Maser

15:30 Panel Session: Knowledge based qual – the future of Reliability testing?
Chair: Derek Ward, NXP Semiconductors

16:00 Close