National Microelectronics Institute

Events

Meeting the Customer Quality Challenge

Venue:

University of Greenwich, Queen Anne Building, Old Royal Naval College, Park Row, 

Greenwich SE10 9LS

Date:
Wed 28 Mar 2012
Time:
900 - 1600
Cost:

FREE to Members and Invited Guests

Booking Details:

Register here

 

UoGreenwich

 

Directions:

Directions to the venue

Map of building in which event is being held - Queen Anne building #2

(Queen Anne Court QA 073; exhibition, registrations and refreshments 
Council Chamber QA 063; presentations)

 

Hotels:

Hotels in Greenwich  

The ibis, Novotel and Davenport House are all within walking distance of the venue.

 

Car Parking:

There are two public car parks near the University at Burney Street and Park Row.

There is also an additional car park in the Royal Park.

If you require direct access to the venue by car e.g. exhibitor, please contact Paul Jarvie

 

Meeting the Customer Quality Challenge

Automotive & Mobile Consumer

Suppliers are comitted to deliver their products according to a variety of Specs and Standards that have developed over the years often originating from early Military or Communications standards.

This Quality & Reliability Network event will examine in Case Study style examples from Automotive & Mobile Consumer markets with views from the experts across the supply chain providing delegates with valuable insight:

Agenda:

09:00 Registration - Refreshments, Networking and Tabletop Exhibitions

09:50 NMI, Paul Jarvie - Welcome and Introduction

          University of Greenwich, Prof. Chris Bailey

           Virtual Prototyping: A tool to assess quality and reliability of electronic products

           Maser Engineering, Kees Revenberg

           AEC Q100 test applications

11:00 Break (Sponsored by Ingenious Quality)

            University of Greenwich, Dr Linda Hyder

            Accessing university expertise in electronics to develop your business, including case study

           LTXC, Peter Cockburn

           Delivering on ISO/TS 16949 through Analysis of Variance at testing process

12:20pm  Buffet Lunch - Networking and Tabletop Exhibition

           City University Hong Kong, Prof. YC Chan

           A view of Customer Quality and Reliability in China

           Reliability Plus, Bob Page & Zytek Automotive, Chris Baggott

           The Smart approach to Reliability

2:30pm Break (Sponsored by Ingenious Quality)

            Discussion Q&A session

16:00 Close

 

Exhibition:

There will be an Exhibition of leading suppliers co-located with the main event presentations and delegates will have an opportunity to access this during the breaks and Networking buffet lunch.

Please contact Paul Jarvie at NMI +44(0)7739427766 if you would like to Sponsor/Exhibit at this event.