Managing the ever increasing risk of ESD damage
3M, Bracknell, RG12 8HT
- Thu 21 Mar 2013
- 900 - 1600
Free to NMI members and invited guests
- Booking Details:
Please register On-Line
Host & Headline Sponsor
Directions & Accommodation:
The Coppid Beech Travel Lodge (within walking distance)
Travelodge Bracknell Hotel (within walking distance)
Hilton Bracknell Hotel (within a short drive)
Understanding and managing the ever increasing risk of ESD (ElectroStatic Discharge) damage is a key factor in ensuring Electronic IC and System Quality and Reliability. As the scale of IC transistor gates shrink year on year, the sensitivity to ESD damage is increased.
This network event will provide delegates with an introduction to ESD Failure mechanisms and methods of protection from Chip to final Application including safe working practice in manufacture process. Industry experts will share case study learning from each of the key steps in Product Design, Development and Manufacture, including examples of ESD damage and root cause analysis.
09:00 Registration open
09:45 Welcome & Introduction NMI, Paul Jarvie & 3M , tbc
10:00 Key Note speaker
Jeremy Smallwood, Electrostatic Solutions
ESD - a lifetime under threat
Martin Adams, 3M
Managing and monitoring ESD in "real time"
Charles Cawthorne, MBDA
ESD – Principles and Control in Manufacturing
12:30 LUNCH - Table Top Exhibits, Networking (1 Hour)
Marcel Dekker, Maser Engineering
New Standards for ESD testing of IC’s
Rhys, Weaver, CSR
Fabless Semiconductor case study
Paul Phillips, PHASIX ESD
Customer case study in ESD measurement approach.
15:30 PANEL Session: Chaired by Jeremy Smallwood, Electrostatic Solutions
Table Top Exhibition & Sponsorship:
For sponsorship and remaining table-top exhibitor opportunities please contact Paul Jarvie by email or Mobile Phone: +44(0)77394 27766