National Microelectronics Institute


Managing the ever increasing risk of ESD damage


3M, Bracknell, RG12 8HT 

Thu 21 Mar 2013
900 - 1600

Free to NMI members and invited guests

Booking Details:

Please register On-Line

Host & Headline Sponsor 


Directions & Accommodation:

Download Map / Directions


The Coppid Beech Travel Lodge (within walking distance)

Travelodge Bracknell Hotel (within walking distance)

Hilton Bracknell Hotel (within a short drive)

Event Overview:

Understanding and managing the ever increasing risk of ESD (ElectroStatic Discharge) damage is a key factor in ensuring Electronic IC and System Quality and Reliability. As the scale of IC transistor gates shrink year on year, the sensitivity to ESD damage is increased.


This network event will provide delegates with an introduction to ESD Failure mechanisms and methods of protection from Chip to final Application including safe working practice in manufacture process. Industry experts will share case study learning from each of the key steps in Product Design, Development and Manufacture, including examples of ESD damage and root cause analysis.


09:00 Registration open

09:45 Welcome & Introduction    NMI, Paul Jarvie &  3M , tbc

10:00 Key Note speaker

Jeremy Smallwood, Electrostatic Solutions

          ESD - a lifetime under threat

Martin Adams, 3M

          Managing and monitoring ESD in "real time"

Charles Cawthorne, MBDA

         ESD – Principles and Control in Manufacturing

12:30 LUNCH - Table Top Exhibits, Networking  (1 Hour)

Marcel Dekker, Maser Engineering

         New Standards for ESD testing of IC’s

Rhys, Weaver, CSR  

        Fabless Semiconductor case study

Paul Phillips, PHASIX ESD

         Customer case study in ESD measurement approach.

15:30 PANEL Session: Chaired by Jeremy Smallwood, Electrostatic Solutions

16:00 Close

Table Top Exhibition & Sponsorship:

For sponsorship and remaining table-top exhibitor opportunities please contact Paul Jarvie by email or Mobile Phone: +44(0)77394 27766