Statistical variability, introduced by the discreteness of charge and matter, is a major concern for CMOS scaling and integration. It critically affects SRAM design, introduces timing issues in digital circuits, restricts supply voltage scaling and increases the power dissipation.

On top of statistical variability, problems related to statistical aspects of reliability are looming
that could reduce the life span of contemporary CMOS circuits and systems from tens of years to
1-2 years, or less, in the near future.

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