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International Conference on CMOS Variability
"The Impact of Variability on Design"
 
Conference Agenda
 
8:30 Registration and Refreshments
 
Welcome by the Rt. Hon. Stephen Timms MP, Minister for Competitiveness
"Welcome to the CMOS Variability Conference"
Key Note by Asen Asenov, University of Glasgow

“Variability in the next generation CMOS technologies and impact on design”


Bart Dierickx, IMEC: “Technology aware design”
Steve Furber, University of Manchester: “Dealing with variability in modern circuit design”
Masami Murakata, STARC: “DFM&Y- Research and development topics in STARC”
 

*** Coffee ***

Christophe Guittard, Mentor Graphics: “The serious impact of "variability" on traditional Place & Route"
Victor Moroz, Synopsys: “OPC corrections and strain - the impact on design”
Pierrick Pedron, Cadence: “SOC Encounter Statistical Design”
 

*** Buffet Lunch & Networking ***

 

David Frank, IBM: “High Performance CMOS variability in the 65nm regime and beyond”
Marcel Pelgrom, NXP: "Nanometer CMOS is a statistical challenge!"
Walter Ganzevles, TSMC: “Solutions for managing increased variability”
 

*** Coffee ***


Yves Laplanche, ARM: “IP design: how sigma is changing our lives?””


Chair: Asen Asenov

17:00 Conference Close immediately followed by:
Post-Conference Drinks Reception & Further Networking
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