Living with Variability: 12th & 13th May 2009. Savoy Place, London
Conference Agenda
- Day 1: Understanding Design for Variability (DfV)
- Day 2: Facing up to Variability
- Detailed Agenda (pdf download)
Day 1: Understanding Design for Variability (DfV)
Tuesday, 12th May 2009
Welcome & Introduction
Paul Jarvie, NMI
SESSION 1: The IDM & Fabless perspective
- Key Note: Variation in 45nm and implications for 32nm and beyond
- Dr Kelin Kuhn, Intel
- Life on the Treadmill
- Krisztián Flautner, ARM
- Statistical variability and reliability in the next generation CMOS technologies and the ITRS response
- Professor Asen Asenov, University of Glasgow
Buffet Lunch & Networking
SESSION 2: Embracing DfV in the Foundry
- Key Note: Variability beyond 45nm: design impact and countermeasures
- Dr Sani Nassif, IBM
- Statistical Static Timing Analysis: A New Approach to Deal with Increased Process Variability in Advanced Nanometer Technologies
- Davide Pandini, ST Microelectronics
- SRAM Variability: Foundry Perspectives
- Nam Sung Kim, Chartered Semiconductors
PANEL: Are we ready for DfV at sub 32nm ?
- Chair: Professor Asen Asenov
Conference Dinner
19:00, Savoy Place
Day 2: Facing up to Variability
Wednesday, 13th May 2009
SESSION 1: The Era of Variability: are EDA Tools ready ?
- Key Note: Managing Variability in next generation design methodologies and tools
- Jean-Marie Brunet, Mentor Graphics
- Realising a 45nm System on Chip for digital TV in the age of Variability
- Andrew Appleby, NXP Semiconductors
- Designing with Variability: An EDA perspective
- Dr Ahsan Bootehsaz, Synopsys
- Design for Variability Efforts in Europe - REALITY project
- Miguel Miranda, IMEC
Buffet Lunch & Networking
SESSION 2: Delivering Product Performance in the face of Variability
- Variability Characterization Infrastructure for Nanometer-Scale Technologies
- Sharad Saxena, PDF Solutions
- Analyzing, preventing and correcting the impact of manufacturing variation in advanced node IC design, including physical and electrical effects induced by Litho and Stress
- Philippe Hurat, Cadence
- Variability-Aware Product Development in a Fabless Environment
- Jeff Watt, Altera
- Variability challenges for analogue and mixed mode design
- Patrick Drennan, Solido Design Automation
PANEL: "If Variability is real: Are we doing enough about it?"
- Chair: Ian Phillips (ARM)
