Motivation:

• FACR Tools are costly for in-house use and require specialised skills.
• Few places have all techniques available.
• There is a lack of knowledge of what services are available and where.
• Cost, Time to Ramp up an quality of product introduction are all impacted.

Objective:

• Create a network of services and sources.
• Provide information on available techniques... "MicroPages".
  MicroPages is under development and the prototype is available in our Members Area.
• Facilitate collaboration, outsourcing and best practices.

Current Themes:

• New standards present a challenge e.g. "Automotive Quality"
• Wide range of tools/techniques.... how to find them?
• Are FACR techniques aligned with Industry future needs?

Click Here to be notified about future network meetings.

Last Event:

28 April 2006, Cambridge (Sponsored by CSR)

Presentations available on Members Forum shortly.

• Achieving Automotive Quality, Nathan Gerrard, CSR
• Surface Analysis - a problem solving tool?, Mike Petty, LSA
• FA Requirements for Power Semiconductor manufacture, Sebastien Meziere, IR
• Failure Analysis Service at Innos and Future Capabilities, Alec Reader, Innos
• Testing to Q100 Automotive Standards, Kees Revenberg, Maser
• Ion Beam techniques for materials modification and analysis, Russell Gwilliam, University of Surrey
• Panel Session: Are techniques aligned with industry future needs?
  LSA - Mike Petty
  CSR - Steve Keppie
  Phillips Semiconductors - Derek Ward
  DELTA - Kim Zachariassen
  Zetex - Ian Smith

Photos

Feedback/Comments
Please record your feedback and suggestions related to this event in the Users Forum area, helping us to improve the quality and value of our Network. Alternatively email Paul Jarvie.