Description

Metryx develops and manufactures advanced metrology systems based on mass metrology. Mass change provides a direct, passive and rapid measurement of process change in a semiconductor process, regardless of whether it is an additive or subtractive process. The process change will manifest as either a single excursion, or a drift and will allow process engineering and excursion management decisions to be made and rapidly implemented. Because mass measurement takes place on product wafers it enables the reduction of non productive test wafers, and provides information quickly on process excursions reducing risk.

Metryx has a worldwide customer base including 300mm, 200mm and 150mm fabs in Europe, US and Asia. Metryx tools are in use on high volume applications in high volume productions fabs as well as in multi application use in smaller fabs.

Metryx has achieved recognition in this highly competitive industry with awards including Semiconductor International Best Product Award, Eurasia Semiconductor Yield Enhancement Award, and two Queens Awards for International Trade and for Innovation.

Metryx is staffed by semiconductor industry professionals from the fields of equipment engineering, process and applications development, and equipment sales and service.

While many of our customers are high volume 300mm fabs, our metrology technique can offer some real cost savings to the mature 200mm fabs that are operated by many of NMI members. These fabs are often running at close to capacity and cost savings represent direct improvements to profitability. Metryx is working with a number of similar companies on activities to reduce test wafer consumption, as well as increased process monitoring to help reduce reliance on slower, more expensive analytical metrology.

Additional contact names;

 Dr Adrian Kiermasz, CEO

 adrian.kiermasz@metryx.net

 Gary Ditmer, Business Development Director, Asia

 gary.ditmer@metryx.net