Description

Measurement & Characterisation to the Nano Scale 

Through CEMMNT, clients benefit from single-point-access to the widest range of state-of-the-art measurement techniques in the UK, ensuring the highest levels of accuracy and performance are achieved. Metrology solutions range from initial wafer level analysis to dynamic characterisation of packaged and unpackaged final devices. Pure wafers are characterised for bow, roughness, dopants, contaminants, crystallinity and sub-surface defects. Processed structures can be characterised dimensionally, chemically, electrically, thermally and mechanically. Defects can be identified at early process stages in order to minimise wastage. 

Your Partner for Grant-Funded Projects 

From overseeing the proposal and negotiation phases through to managing project delivery, CEMMNT’s in-depth experience of collaborative research initiatives, combined with significant access to a broad range of industry and academia, enable it to work with both UK and European organisations, providing you with the support and services required to ensure your project is a success. 

Dedicated Modelling & Simulation Software 

Additionally, clients benefit from rapid access to the capabilities of CEMMNT partner, Coventor, a world leading provider of 3D MEMS simulation, analysis and design automation software for the development of micro electro-mechanical systems (MEMS). Software offerings include MEMS+, CoventorWare and SEMulator 3D.

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